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Statistical modeling, design, centering, yield optimization and cost-driven design

dc.contributor.authorBandler, John
dc.date.accessioned2023-08-17T19:03:02Z
dc.date.available2023-08-17T19:03:02Z
dc.date.issued1995-05-19
dc.descriptionSlides for a presentation given on May 19, 1995 at the 1995 IEEE MTT-S International Microwave Symposium, in Orlando, Florida. Bandler presented these slides in the workshop on “CAD design methodology for commercial applications” organized and chaired by Anthony M. Pavio.en_US
dc.description.abstractThis presentation addresses the challenges of microwave integrated circuit design technology. Included are the following topics: statistical device modeling; device centering; yield optimization; cost-driven design; space mapping optimization; physical device and circuit optimization; electromagnetic optimization; and novel topics in engineering optimization.en_US
dc.identifier.citationBandler, John, “Statistical modeling, design, centering, yield optimization and cost-driven design,” Workshop on CAD design methodology for commercial applications, IEEE MTT-S International Microwave Symposium, Orlando, Florida, May 19, 1995.en_US
dc.identifier.urihttp://hdl.handle.net/11375/28798
dc.language.isoen_USen_US
dc.publisherOptimization Systems Associates Inc.en_US
dc.subjectstatistical device modelingen_US
dc.subjectdevice centeringen_US
dc.subjectyield optimizationen_US
dc.subjectcost-driven designen_US
dc.subjectspace mappingen_US
dc.subjectelectromagnetic optimizationen_US
dc.titleStatistical modeling, design, centering, yield optimization and cost-driven designen_US
dc.typePresentationen_US

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