Statistical modeling, design, centering, yield optimization and cost-driven design
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Optimization Systems Associates Inc.
Abstract
This presentation addresses the challenges of microwave integrated circuit design technology. Included are the following topics: statistical device modeling; device centering; yield optimization; cost-driven design; space mapping optimization; physical device and circuit optimization; electromagnetic optimization; and novel topics in engineering optimization.
Description
Slides for a presentation given on May 19, 1995 at the 1995 IEEE MTT-S International Microwave Symposium, in Orlando, Florida. Bandler presented these slides in the workshop on “CAD design methodology for commercial applications” organized and chaired by Anthony M. Pavio.
Citation
Bandler, John, “Statistical modeling, design, centering, yield optimization and cost-driven design,” Workshop on CAD design methodology for commercial applications, IEEE MTT-S International Microwave Symposium, Orlando, Florida, May 19, 1995.