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Ion Impact Chemistry in the System Ti-O

dc.contributor.advisorKelly, Roger
dc.contributor.authorParker, Thomas E.
dc.contributor.departmentMetallurgy and Materials Scienceen_US
dc.date.accessioned2016-07-25T15:34:55Z
dc.date.available2016-07-25T15:34:55Z
dc.date.issued1973-04
dc.descriptionTitle: Ion Impact Chemistry in the System Ti-O, Author: Thomas E. Parker, Location: Thodeen_US
dc.description.abstract<p>This thesis considers the characterization of the phenomenon of the induced conductivity changes in TiO2 under the influence of krypton and oxygen ion bombardment and the damage layer associated with these changes. The investigation included the examination of the irradiated and irradiated specimens (variously-single crystals and polycrystals), using electron microscopy techniques to reveal surface structural alterations; electrical conductivity measurements to assess the response to irradiation; dissolution experiments of the bombarded region to estimate the thickness and radioactive inert gas marker release to monitor the annealing stages of the damage.</p> <p> The results included the observation of lower oxide formation under ion impact and its identification as Ti2O3 and suggest a technique for producing lower oxides of transition metal oxides that have a semiconductor to metal transition of technological interest.</p>en_US
dc.description.degreeMaster of Engineering (ME)en_US
dc.description.degreetypeThesisen_US
dc.identifier.urihttp://hdl.handle.net/11375/19925
dc.language.isoenen_US
dc.titleIon Impact Chemistry in the System Ti-Oen_US
dc.typeThesisen_US

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