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Study of III-V Semiconductors by Spatially-resolved and Polarization-resolved Photoluminescence

dc.contributor.advisorCassidy, D.T.en_US
dc.contributor.authorYang, Jian (Jim)en_US
dc.contributor.departmentEngineering Physicsen_US
dc.date.accessioned2014-06-18T16:35:26Z
dc.date.available2014-06-18T16:35:26Z
dc.date.created2010-06-20en_US
dc.date.issued1995-02en_US
dc.description.abstract<p>Spatially-resolved and polarization resolved photoluminescence has been used to study the photoelastic effect and the correlation between strain fields on the facet and along the active region in semiconductor diode lasers. The spectral mapping ability of this technique has been developed and has been demonstrated to be a useful tool for the study of quantum well intermixing processes in InGaAsP systems.</p>en_US
dc.description.degreeDoctor of Philosophy (PhD)en_US
dc.identifier.otheropendissertations/1751en_US
dc.identifier.other3150en_US
dc.identifier.other1364315en_US
dc.identifier.urihttp://hdl.handle.net/11375/6439
dc.subjectEngineering Physicsen_US
dc.subjectEngineering Physicsen_US
dc.titleStudy of III-V Semiconductors by Spatially-resolved and Polarization-resolved Photoluminescenceen_US
dc.typethesisen_US

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