Please use this identifier to cite or link to this item:
http://hdl.handle.net/11375/31362| Title: | Development of online whole-surface apple inspection system using line-scan hyperspectral imaging technology (Conference Presentation) |
| Authors: | Baek I Gadsden SA Kim MS |
| Department: | Mechanical Engineering |
| Keywords: | 4605 Data Management and Data Science;46 Information and Computing Sciences |
| Publication Date: | 15-May-2018 |
| Publisher: | SPIE, the international society for optics and photonics |
| URI: | http://hdl.handle.net/11375/31362 |
| metadata.dc.identifier.doi: | https://doi.org/10.1117/12.2307235 |
| Appears in Collections: | Mechanical Engineering Publications |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 068-Development of online whole-surface apple inspection system using line-scan hyperspectral imaging technology (Conference Presentation).pdf | Supporting information | 552.64 kB | Adobe PDF | View/Open |
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