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Development of online whole-surface apple inspection system using line-scan hyperspectral imaging technology (Conference Presentation)

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dc.contributor.authorBaek I
dc.contributor.authorGadsden SA
dc.contributor.authorKim MS
dc.contributor.departmentMechanical Engineering
dc.contributor.editorKim MS
dc.contributor.editorCho B-K
dc.contributor.editorChin BA
dc.contributor.editorChao K
dc.date.accessioned2025-03-03T23:27:19Z
dc.date.available2025-03-03T23:27:19Z
dc.date.issued2018-05-15
dc.date.updated2025-03-03T23:27:18Z
dc.identifier.doihttps://doi.org/10.1117/12.2307235
dc.identifier.urihttp://hdl.handle.net/11375/31362
dc.publisherSPIE, the international society for optics and photonics
dc.subject4605 Data Management and Data Science
dc.subject46 Information and Computing Sciences
dc.titleDevelopment of online whole-surface apple inspection system using line-scan hyperspectral imaging technology (Conference Presentation)
dc.typeArticle

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