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Please use this identifier to cite or link to this item: http://hdl.handle.net/11375/21830
Title: Connectivity of Phases and Growth Mechanisms in Peritectic Alloys Solidified at Low Speed: an X-Ray Tomography Study of Cu-Sn
Authors: Rappaz, M.
Kohler, F.
Valloton, J.
Phillion, A.B.
Stampanoni, M.
Department: Materials Science and Engineering
Publication Date: Mar-2010
Publisher: Springer
Citation: Rappaz, M., et al. "Connectivity of Phases and Growth Mechanisms in Peritectic Alloys Solidified at Low Speed: an X-Ray Tomography Study of Cu-Sn." Metallurgical and Materials Transactions A 41.3 (2010): 563-567.
Abstract: The variety of microstructures that form at low solidi cation speed in peritectic alloys, -bands, islands or even coupled (or cooperative) growth of the primary alpha- and peritectic beta-phases-, have been previously explained by nucleation-growth mechanisms. In a recent investigation on Cu-Sn, a new growth mechanism was conjectured on the basis of 2-dimensional optical microscopy and Electron Back-Scattered Diffraction (EBSD) observations made in longitudinal sections. In the present contribution, X-ray tomography has been used to confi rm this mechanism: alpha- and beta-phases can be totally inter-connected in 3 dimensions and bands (or islands) can result from an overlay mechanism, rather than from a nucleation events sequence. When the lateral growth of a new layer is too fast, an instability can lead to the formation of a lamellar structure as for eutectic alloys.
URI: http://hdl.handle.net/11375/21830
Appears in Collections:Materials Science and Engineering Publications

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