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http://hdl.handle.net/11375/20777| Title: | A Circuit and Noise Model of Metal-Oxide-Semiconductor Field-Effect Transistor |
| Authors: | Yeh, Chuan-Sung |
| Advisor: | Chisholm, S. H. |
| Department: | Electrical Engineering |
| Keywords: | circuit, noise, metal, oxide, semiconductor, field-effect, transistor |
| Publication Date: | May-1966 |
| Abstract: | <p> The Metal-Oxide Semiconductor Field-Effect Transistor is first analyzed from an active R-C transmission line view-point. The small signal circuit model and the noise model of the device are then derived and experimental results presented.</p> <p> A Chronologically arranged bibliography concerning MOS devices and associated noise studies is included at the end of this thesis.</p> |
| URI: | http://hdl.handle.net/11375/20777 |
| Appears in Collections: | Digitized Open Access Dissertations and Theses |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Yeh_Chuan-Sung_1966May_Masters..pdf | 3.16 MB | Adobe PDF | View/Open |
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