New Strategies for Data Acquisition in Electron Ptychography: Energy Filtering and Reduced Sampling

Abstract

Electron Ptychography is a technique to retrieve the phase information of the medium through which the electron wave travels in a Transmission Electron Microscope (TEM). Phase calculation is carried out by acquiring an oversampled dataset of diffraction patterns from the sample and execution of a Fourier-based mathematical solution or algorithm using the collected dataset of intensity patterns. The phase of the electron wave contains valuable information about the structure of the material under study. In this contribution, we provide a scientific background necessary for understanding the phase calculation method, examine the capabilities and limitations of the Electron Ptychography in experimental setup and introduce two novel methods to increase the signal to noise ratio by using the same dose budget used in a classic Ptychography experiment.