Whole-surface round object imaging method using line-scan hyperspectral imaging system
| dc.contributor.author | Baek I | |
| dc.contributor.author | Gadsden SA | |
| dc.contributor.author | Cho BK | |
| dc.contributor.author | Lee H | |
| dc.contributor.author | Kim MS | |
| dc.contributor.department | Mechanical Engineering | |
| dc.contributor.editor | Kim MS | |
| dc.contributor.editor | Chao K | |
| dc.contributor.editor | Chin BA | |
| dc.date.accessioned | 2025-02-27T20:21:18Z | |
| dc.date.available | 2025-02-27T20:21:18Z | |
| dc.date.issued | 2016-05-17 | |
| dc.date.updated | 2025-02-27T20:21:18Z | |
| dc.description.abstract | To achieve comprehensive online quality and safety inspection of fruits, whole-surface sample presentation and imaging regimes must be considered. Specifically, sample presentation method for round objects is under development to achieve effective whole-surface sample evaluation based on the use of a single hyperspectral line-scan imaging device. In this paper, a whole-surface round-object imaging method using hyperspectral line-scan imaging techniques is presented. | |
| dc.identifier.doi | https://doi.org/10.1117/12.2225859 | |
| dc.identifier.issn | 0277-786X | |
| dc.identifier.issn | 1996-756X | |
| dc.identifier.uri | http://hdl.handle.net/11375/31241 | |
| dc.publisher | SPIE, the international society for optics and photonics | |
| dc.subject | 40 Engineering | |
| dc.subject | 4006 Communications Engineering | |
| dc.subject | 4009 Electronics, Sensors and Digital Hardware | |
| dc.subject | 51 Physical Sciences | |
| dc.subject | 5102 Atomic, Molecular and Optical Physics | |
| dc.title | Whole-surface round object imaging method using line-scan hyperspectral imaging system | |
| dc.type | Article |
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