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FEA MODELING OF A TRIBOMETER’S PIN AND DISK INTERACTION

dc.contributor.advisorWu, Peidongen_US
dc.contributor.advisorVeldhuis, Stephenen_US
dc.contributor.advisorMateusz P. Sklad, Eu-Gene Ngen_US
dc.contributor.authorLi, Haoyuen_US
dc.contributor.departmentMechanical Engineeringen_US
dc.date.accessioned2014-06-18T17:00:03Z
dc.date.available2014-06-18T17:00:03Z
dc.date.created2012-09-24en_US
dc.date.issued2012-10en_US
dc.description.abstract<p>A bench scale tribometer, developed at the McMaster Manufacturing Research Institute (MMRI) was designed for mimicking the friction and wear conditions on the rake face of a metal cutting tool. It provides insight into the performance of cutting tools operating under high stress and high temperature machining conditions. It saves test material costs, reduces machine downtime for testing, increases the number of test replicates and effectively adds a reliable testing tool to characterize metal cutting operations.</p> <p>A detailed investigation into the stress distribution, temperature profile and indentation pattern has been performed in order to verify the ability of the device to capture the machining environment and to gain a better understanding of the friction effects and wear conditions. The investigation used finite element analysis to simulate the MMRI’s tribometer with the FEA results compared to the experimental results. This data was then used to tune the operating conditions of the tribometer to improve its ability to simulate the machining environment.<strong></strong></p>en_US
dc.description.degreeMaster of Applied Science (MASc)en_US
dc.identifier.otheropendissertations/7446en_US
dc.identifier.other8502en_US
dc.identifier.other3346670en_US
dc.identifier.urihttp://hdl.handle.net/11375/12571
dc.subjectTribometeren_US
dc.subjectFinite Element Analysisen_US
dc.subjectMetal Cuttingen_US
dc.subjectFrictionen_US
dc.subjectWearen_US
dc.subjectPin and Disken_US
dc.subjectManufacturingen_US
dc.subjectManufacturingen_US
dc.titleFEA MODELING OF A TRIBOMETER’S PIN AND DISK INTERACTIONen_US
dc.typethesisen_US

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