TOTAL REFLECTION OF 3.2 cm MICROWAVES III A DIELECTRIC PRISM MODIFIED BY CONDUCTING AND ABSORBING SCREENS

Abstract

A detail description of the apparatus for field intensity measurement was given in Chapter I. Field behaviour inside the microwave absorbing walls without the prism was studied and described in Chapter II. Field patterns behind the totally reflecting surface of the prism modified by conducting and absorbing screens were studied and reported in Chapter III.