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Diode Laser Dynamics

dc.contributor.advisorGarside, B.K.en_US
dc.contributor.authorGoodwin, John C.en_US
dc.contributor.departmentElectrical Engineeringen_US
dc.date.accessioned2014-06-18T16:34:24Z
dc.date.available2014-06-18T16:34:24Z
dc.date.created2010-04-06en_US
dc.date.issued1983en_US
dc.description.abstract<p>The work described in this thesis concerns the investigation of diode laser dynamics on the time scale of 100 picoseconds or less. Predictive models based upon the diode laser rate equations are developed. A requirement of such predictive models is that the necessary parameter values be determined by methods independent of the comparison between model predictions and experimental verification. For this reason, a great deal of effort has been directed towards the careful utilization of existing techniques for parameter determination and the development of new techniques where existing techniques were lacking or inadequate.</p> <p>Two dynamical operating regimes are investigated. The first deals with single current pulse pumping of the laser. A time domain model (JLASER), allowing explicitly for wavelength dependence of system parameters and dynamics, was developed and is shown to generate good agreement with experimental measurements of the relaxation oscillation response to the current pulse excitation. The spontaneous emission and the multi-mode nature of the laser are shown to be of particular importance in determining the diode laser pulsed response.</p> <p>The other operating regime investigated is active modelocking of the diode laser in an external cavity. This mode of operation allows extremely short pulses to be obtained, with a much milder current modulation requirement and therefore better spectral control, than in the case of single current pulse pumping. A frequency domain model, incorporating the effects of chip facet reflectivity and gain saturation, is developed. Good agreement is found between this model and experimental measurements of the modelocked pulse characteristics. The detailed characterization carried out on the external cavity coupling efficiency is shown to be critical for accurate model predictions.</p>en_US
dc.description.degreeDoctor of Philosophy (PhD)en_US
dc.identifier.otheropendissertations/1517en_US
dc.identifier.other2176en_US
dc.identifier.other1262908en_US
dc.identifier.urihttp://hdl.handle.net/11375/6188
dc.subjectElectrical and Electronicsen_US
dc.subjectElectrical and Electronicsen_US
dc.titleDiode Laser Dynamicsen_US
dc.typethesisen_US

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