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SIMULATOR INDEPENDENT EXACT ADJOINT SENSITIVITY ANALYSIS OF SELF-ADJOINT MICROWAVE STRUCTURES

dc.contributor.advisorNikolova, Natalia K.en_US
dc.contributor.advisorBandler, John W.en_US
dc.contributor.advisorMohamed H. Bakr, Ali Emadien_US
dc.contributor.authorDadash, Mohammad Sadeghen_US
dc.contributor.departmentElectrical and Computer Engineeringen_US
dc.date.accessioned2014-06-18T16:53:35Z
dc.date.available2014-06-18T16:53:35Z
dc.date.created2011-08-31en_US
dc.date.issued2011-10en_US
dc.description.abstract<p>This thesis proposes a new analytical self-adjoint sensitivity analysis to calculate the Jacobian of the <em>S</em>-parameters for metallic shape parameters. This method is independent of the full-wave numerical analysis and the respective system matrix. The theory works for both volumetric and infinitesimally thin metallic shapes. It exploits the computational efficiency of the self-adjoint sensitivity analysis (SASA) approach where only one EM simulation suffices to obtain both the responses and their gradients in the designable parameter space.</p> <p>There are three major advantages to this development: (1) the Jacobian computation for metallic structures is completely analytical and there is no approximation involved in the sensitivity analysis of shape parameters; (2) the implementation is straightforward and in the form of a post-processing algorithm operating on the exported field solutions on the surface or around the edge of the metallic structure; and (3) it provides the possibility for exact sensitivity analysis with all electromagnetic high-frequency simulators whose system matrices are not available to export or are not differentiable with respect to shape parameters, e.g., simulators based on the FDTD method and the MoM.</p> <p>The method was verified in a number of examples using a commercial finite-element solver. The agreement between the results calculated with the proposed method and the reference self-adjoint sensitivity curves provided with the simulator are very promising.</p> <p>Suggestions for future work are provided.</p>en_US
dc.description.degreeMaster of Applied Science (MASc)en_US
dc.identifier.otheropendissertations/6098en_US
dc.identifier.other7126en_US
dc.identifier.other2208106en_US
dc.identifier.urihttp://hdl.handle.net/11375/11103
dc.subjectsensitivity analysisen_US
dc.subjectfrequency-domain analysisen_US
dc.subjectcomputer aided design (CAD)en_US
dc.subjectresponse Jacobianen_US
dc.subjectElectromagnetics and photonicsen_US
dc.subjectElectromagnetics and photonicsen_US
dc.titleSIMULATOR INDEPENDENT EXACT ADJOINT SENSITIVITY ANALYSIS OF SELF-ADJOINT MICROWAVE STRUCTURESen_US
dc.typethesisen_US

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