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Ga-Assisted Nanowire Growth on Nano-Patterned Silicon

dc.contributor.advisorLaPierre, Ray
dc.contributor.authorGibson, Sandra Jean
dc.contributor.departmentEngineering Physicsen_US
dc.date.accessioned2014-12-15T16:16:06Z
dc.date.available2014-12-15T16:16:06Z
dc.date.issued2015-06
dc.description.abstractGaAs nanowires (NW) have been grown on Si (111) substrates by the self-assisted vapor-liquid-solid (VLS) mechanism using molecular beam epitaxy (MBE). Substrates were prepared with nano-patterned oxide templates using electron beam lithography (EBL) in order to achieve position controlled NW growth. Early experiments uncovered several key issues with regards to the patterning process. Cross-sectional lamella prepared using the focused-ion beam (FIB) technique were used to study the NW-substrate interface using transmission electron microscopy (TEM). Undesirable growth outcomes were found to be caused in part by an unintended residual layer of oxide. Uniform NW dimensions were then obtained by improving the pattern transfer method. The effects of deposition parameters on the growth results were then explored in further experiments. The first systematic study of the axial and radial growth rates of vertical NWs in the positioned array was conducted. It was proposed that the observed expansion of the Ga droplet in Ga-rich growth conditions results in a slight inverse tapered morphology, promoting significant radial growth. While the growth rates were shown to be approximately constant in time, their measured values were found to increase with increasing pattern pitch and decrease with increasing hole diameter. A phenomenological model was then developed based on the principle of mass conservation. A fit to the experimental data was obtained by calculating the collection of growth material supplied by a secondary flux of both gallium and arsenic species desorbing from the oxide surface between the NWs, subsequently impinging on the liquid droplet and NW sidewalls. The reduction of this contribution due to shading of the incident and scattered flux by neighboring NWs in the array was able to account for the differences in final NW morphologies observed with increasing pattern pitch. This model demonstrates the significant impact of secondary adsorption in patterned self-assisted NW growth.en_US
dc.description.degreeDoctor of Science (PhD)en_US
dc.description.degreetypeThesisen_US
dc.identifier.urihttp://hdl.handle.net/11375/16553
dc.language.isoenen_US
dc.subjectnanostructureen_US
dc.subjectsemiconductoren_US
dc.subjectmolecular beam epitaxyen_US
dc.subjectnanowiresen_US
dc.titleGa-Assisted Nanowire Growth on Nano-Patterned Siliconen_US
dc.typeThesisen_US

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