RoMPE™ Product Summary

Abstract

RoMPE™ (Robust Model Parameter Extractor) is a very powerful program for extraction of FET model parameters from measurement data. It benefits from several years of theoretical research and incorporates the latest results by Bandler, Chen, Ye and Zhang: "Robust model parameter extraction using large-scale optimization concepts", 1988 IEEE MTT-S International Microwave Symposium Digest (New York, NY), pp. 319-322. RoMPE accepts measurement data in the form of small-signal S-parameter and/or DC bias measurements. Depending on what type of data is available, RoMPE can be used to extract DC model parameters, small-signal model parameters, or, as a unique feature, both DC and small-signal parameters simultaneously. RoMPE offers the combined power of novel techniques in device modeling and the state-of-the-art gradient-based L1 and L2 optimizers through a friendly and uncomplicated user-interface. The input file adopts a format similar to that of Super-Compact® and Microwave Harmonica™. The program also features high-quality graphics displays. Currently, RoMPE supports two popular FET models, namely the Materka and Kacprzak model and the Microwave Harmonica™ model. October 1988