Development of a Low-Energy Ion Scattering Surface Analysis System Using a Time-of-Flight Method

Abstract

An ion scattering surface analysis system using TOF energy-analysis of the scattered ions was improved with a duoplasmatron ion source and new data-handling electronics. The new source gave greater beam current and stability. The new electronics were: a timing filter amplifier and constant fraction discriminator. Much work was done on alignment of the sample in the beam and reduction of the spot size. To add to the flexibility of the beam guidance system a new pair of steering plates was added. Some of the test spectra are presented to show the operation of the system. Relevant material on various aspects of the system are presented in the appendices.