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Theoretical and Experimental Investigation for the Effect Strain on the Below Threshold Output of InGaAsP Diode Lasers

dc.contributor.advisorCassidy, Daniel
dc.contributor.authorCheng, Chen
dc.contributor.departmentEngineering Physicsen_US
dc.date.accessioned2020-01-30T17:23:25Z
dc.date.available2020-01-30T17:23:25Z
dc.date.issued1992-09
dc.description.abstractThe effect of strain (stress) on the below threshold output of InGaAsP diode lasers has been investigated theoretically and experimentally. The degree of polarization (DOP) and the polarization- resolved spectral output (PRSO) were obtained as a function of the external stress applied to the device. A correlation between the DOP and the peak of the PRSO as a function of the stress was found. This correlation suggests that below threshold, DOP can be used to measure the strain in the active region of lasers. A model based on a strain modified Shockley matrix for the band calculation and a strain modified dipole moment for the optical emission has been constructed to bridge the correlation between the DOP and PRSO.en_US
dc.description.degreeMaster of Engineering (ME)en_US
dc.description.degreetypeThesisen_US
dc.identifier.urihttp://hdl.handle.net/11375/25226
dc.language.isoenen_US
dc.subjecttheoretical investigationen_US
dc.subjectelectrical investigationen_US
dc.subjectstrain effecten_US
dc.subjectthreshold outputen_US
dc.subjectInGaAsP diodeen_US
dc.subjectdiode lasersen_US
dc.titleTheoretical and Experimental Investigation for the Effect Strain on the Below Threshold Output of InGaAsP Diode Lasersen_US
dc.typeThesisen_US

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