Please use this identifier to cite or link to this item:
http://hdl.handle.net/11375/9800
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | Tiku, M. L. | en_US |
dc.contributor.author | Chawla, Satwant | en_US |
dc.date.accessioned | 2014-06-18T16:48:21Z | - |
dc.date.available | 2014-06-18T16:48:21Z | - |
dc.date.created | 2009-06-19 | en_US |
dc.date.issued | 1975-05 | en_US |
dc.identifier.other | opendissertations/489 | en_US |
dc.identifier.other | 1125 | en_US |
dc.identifier.other | 876509 | en_US |
dc.identifier.uri | http://hdl.handle.net/11375/9800 | - |
dc.description.abstract | <p>Several test statistics, which are known, can be used for testing for outliers. Two new statistics T and tc are proposed. T and tc are based on censored and complete samples and are similar to Tiku's T and tc statistics for testing for normality. The distribution of T is closely approximated by the Beta distribution, and the distribution of tc is closely approximated by Student's t distribution. T and tc are also both origin and scale invariant. Besides T and tc are easy to calculate. The statistic T is more powerful than Tietjen and Moore's statistics Lr and Er. The statistic tc is, on the whole, as powerful as Er.</p> | en_US |
dc.subject | Applied Statistics | en_US |
dc.subject | Applied Statistics | en_US |
dc.title | Testing For Outliers | en_US |
dc.type | thesis | en_US |
dc.contributor.department | Statistics | en_US |
dc.description.degree | Master of Science (MS) | en_US |
Appears in Collections: | Open Access Dissertations and Theses |
Files in This Item:
File | Size | Format | |
---|---|---|---|
fulltext.pdf | 945.08 kB | Adobe PDF | View/Open |
Items in MacSphere are protected by copyright, with all rights reserved, unless otherwise indicated.