Please use this identifier to cite or link to this item:
http://hdl.handle.net/11375/31241
Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Baek I | - |
dc.contributor.author | Gadsden SA | - |
dc.contributor.author | Cho BK | - |
dc.contributor.author | Lee H | - |
dc.contributor.author | Kim MS | - |
dc.contributor.editor | Kim MS | - |
dc.contributor.editor | Chao K | - |
dc.contributor.editor | Chin BA | - |
dc.date.accessioned | 2025-02-27T20:21:18Z | - |
dc.date.available | 2025-02-27T20:21:18Z | - |
dc.date.issued | 2016-05-17 | - |
dc.identifier.issn | 0277-786X | - |
dc.identifier.issn | 1996-756X | - |
dc.identifier.uri | http://hdl.handle.net/11375/31241 | - |
dc.description.abstract | To achieve comprehensive online quality and safety inspection of fruits, whole-surface sample presentation and imaging regimes must be considered. Specifically, sample presentation method for round objects is under development to achieve effective whole-surface sample evaluation based on the use of a single hyperspectral line-scan imaging device. In this paper, a whole-surface round-object imaging method using hyperspectral line-scan imaging techniques is presented. | - |
dc.publisher | SPIE, the international society for optics and photonics | - |
dc.subject | 40 Engineering | - |
dc.subject | 4006 Communications Engineering | - |
dc.subject | 4009 Electronics, Sensors and Digital Hardware | - |
dc.subject | 51 Physical Sciences | - |
dc.subject | 5102 Atomic, Molecular and Optical Physics | - |
dc.title | Whole-surface round object imaging method using line-scan hyperspectral imaging system | - |
dc.type | Article | - |
dc.date.updated | 2025-02-27T20:21:18Z | - |
dc.contributor.department | Mechanical Engineering | - |
dc.identifier.doi | https://doi.org/10.1117/12.2225859 | - |
Appears in Collections: | Mechanical Engineering Publications |
Files in This Item:
File | Description | Size | Format | |
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054-gadsden_conf_054.pdf | Published version | 510.38 kB | Adobe PDF | View/Open |
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