Please use this identifier to cite or link to this item:
http://hdl.handle.net/11375/28798| Title: | Statistical modeling, design, centering, yield optimization and cost-driven design |
| Authors: | Bandler, John |
| Keywords: | statistical device modeling;device centering;yield optimization;cost-driven design;space mapping;electromagnetic optimization |
| Publication Date: | 19-May-1995 |
| Publisher: | Optimization Systems Associates Inc. |
| Citation: | Bandler, John, “Statistical modeling, design, centering, yield optimization and cost-driven design,” Workshop on CAD design methodology for commercial applications, IEEE MTT-S International Microwave Symposium, Orlando, Florida, May 19, 1995. |
| Abstract: | This presentation addresses the challenges of microwave integrated circuit design technology. Included are the following topics: statistical device modeling; device centering; yield optimization; cost-driven design; space mapping optimization; physical device and circuit optimization; electromagnetic optimization; and novel topics in engineering optimization. |
| Description: | Slides for a presentation given on May 19, 1995 at the 1995 IEEE MTT-S International Microwave Symposium, in Orlando, Florida. Bandler presented these slides in the workshop on “CAD design methodology for commercial applications” organized and chaired by Anthony M. Pavio. |
| URI: | http://hdl.handle.net/11375/28798 |
| Appears in Collections: | Optimization Systems Associates |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Bandler_Statistical_Modeling_CAD_Design_Methodology_IMS_1995_Workshop_May_19_1995.pdf | 8.3 MB | Adobe PDF | View/Open |
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