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DC Field | Value | Language |
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dc.contributor.author | Bandler, John | - |
dc.date.accessioned | 2023-08-17T19:03:02Z | - |
dc.date.available | 2023-08-17T19:03:02Z | - |
dc.date.issued | 1995-05-19 | - |
dc.identifier.citation | Bandler, John, “Statistical modeling, design, centering, yield optimization and cost-driven design,” Workshop on CAD design methodology for commercial applications, IEEE MTT-S International Microwave Symposium, Orlando, Florida, May 19, 1995. | en_US |
dc.identifier.uri | http://hdl.handle.net/11375/28798 | - |
dc.description | Slides for a presentation given on May 19, 1995 at the 1995 IEEE MTT-S International Microwave Symposium, in Orlando, Florida. Bandler presented these slides in the workshop on “CAD design methodology for commercial applications” organized and chaired by Anthony M. Pavio. | en_US |
dc.description.abstract | This presentation addresses the challenges of microwave integrated circuit design technology. Included are the following topics: statistical device modeling; device centering; yield optimization; cost-driven design; space mapping optimization; physical device and circuit optimization; electromagnetic optimization; and novel topics in engineering optimization. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | Optimization Systems Associates Inc. | en_US |
dc.subject | statistical device modeling | en_US |
dc.subject | device centering | en_US |
dc.subject | yield optimization | en_US |
dc.subject | cost-driven design | en_US |
dc.subject | space mapping | en_US |
dc.subject | electromagnetic optimization | en_US |
dc.title | Statistical modeling, design, centering, yield optimization and cost-driven design | en_US |
dc.type | Presentation | en_US |
Appears in Collections: | Optimization Systems Associates |
Files in This Item:
File | Description | Size | Format | |
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Bandler_Statistical_Modeling_CAD_Design_Methodology_IMS_1995_Workshop_May_19_1995.pdf | 8.3 MB | Adobe PDF | View/Open |
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