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Title: | Microwave component design using space mapping methodologies |
Authors: | Bandler, John |
Keywords: | microwaves;design optimization;CAD;space mapping;space-mapping techniques;space-mapped models;engineering optimization;neural space mapping;neuromodeling;ANN;knowledge-based;companion modeling;microwave filters;coarse mesh;yield-driven design;LTCC filters |
Publication Date: | 3-Jun-2002 |
Citation: | Bandler, John, “Microwave component design using space mapping methodologies,” Workshop, IEEE MTT-S International Microwave Symposium, Seattle, Washington, June 3, 2002. |
Abstract: | Microwave engineers have been using optimization techniques for device, component and circuit modeling and CAD for decades. Automatic optimization in modeling, simulation and design is now taken for granted. One of the frontiers that remain is the successful application of optimization procedures in problems for which direct application of traditional optimization approaches is not practical. The recent exploitation of iteratively refined surrogates of "fine" or accurate models, and the implementation of space mapping and related methodologies can be viewed as attempts to address this issue. Space mapping optimization intelligently links companion "coarse" and "fine" models of different complexities. Examples include full-wave electromagnetic simulations with empirical circuit- theory based simulations, or devices under test with a suitable simulation surrogate. The aim is to accelerate iterative design optimization. It is a simple CAD methodology, which closely follows the traditional experience and intuition of microwave designers, yet can be rigorously grounded mathematically. The exploitation of properly managed space mapped models promises significant efficiency in engineering design optimization practices. This workshop will bring together the foremost practitioners in these fields including microwave component designers, software developers and academic innovators. They will focus on the state of the art and address designers' needs for effective tools for optimal designs, including yield optimization, exploiting accurate physically based device and component models. Current progress in the development and application of suitable algorithms and software engines will be presented. The concepts address the contradictory challenge of exploitation of device and system models that are both accurate and fast. |
Description: | Slides for a workshop given at the 2002 IEEE MTT-S International Microwave Symposium, organized and chaired by John W. Bandler. Speakers included Bandler, J.E. Rayas-Sánchez, A.M. Pavio, S. Safavi-Naeini, D. Pelz, K. Madsen, J.W. Lobeek, Q.J. Zhang, and K.L. Wu. |
URI: | http://hdl.handle.net/11375/28761 |
Appears in Collections: | John Bandler Slides |
Files in This Item:
File | Description | Size | Format | |
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IMS_2002_Microwave_Component_Design_Space_Mapping_Workshop_June_3_2002.pdf | 62.04 MB | Adobe PDF | View/Open |
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