Please use this identifier to cite or link to this item:
http://hdl.handle.net/11375/19876
Title: | Some Ion-Bombardment Effects on Copper-Gold Alloys |
Authors: | Newcombe, Richard G. |
Advisor: | Thompson, D.A. Carter, G. |
Department: | Engineering Physics |
Publication Date: | Aug-1980 |
Abstract: | <p>This report discusses some of the effects of medium-energy ion-bombardment on various copper-gold alloys. Thin (20nm-150nm) films of copper-gold alloys, on Si or SiO2 substrates, were bombarded with 30keV Ar+, 45keV Ar+, or 45 keV Bi+ ions, to fluences of up to 8 x 10^14 ions/mm2. One of the targets was held at ~50°K; the others were irradiated at room temperature. The effects were observed by 1.00 and 2.00 MeV He+ ion Rutherford backscattering. The results are discussed in terms of preferential sputtering, gas trapping, and surface topography.</p> |
Description: | Title: Some Ion-Bombardment Effects on Copper-Gold Alloys, Author: Richard G. Newcombe, Location: Thode |
URI: | http://hdl.handle.net/11375/19876 |
Appears in Collections: | Open Access Dissertations and Theses |
Files in This Item:
File | Description | Size | Format | |
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Newcombe_Richard_G_1980_08_master.pdf | Title: Some Ion-Bombardment Effects on Copper-Gold Alloys, Author: Richard G. Newcombe, Location: Thode | 1.66 MB | Adobe PDF | View/Open |
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