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THE MICROWAVE MEASUREMENT OF THE COMPLEX PERMITIVITY OF SEMI-CONDUCTIVITY

dc.contributor.advisorGunn, M. W.
dc.contributor.authorSHEIKH, RIAZ H
dc.contributor.departmentElectrical Engineeringen_US
dc.date.accessioned2024-08-07T01:37:17Z
dc.date.available2024-08-07T01:37:17Z
dc.date.issued1965-09
dc.description.abstractMeasurements based on the reflection of electromagnetic waves of frequency 9.28 ge/s from the n-type germanium samples placed in a section of wave guide were carried out, The resistivity of the samples investigated ranged from 1 ohm-cm. to 50 ohm-cm. Accurate results were obtained with a microwave reflection bridge on the samples with resistivities at the high and of the range. For the measurement of low resistivity samples, a partially filled guide system was proposed and investigated. Measurements for such a system wore found to be in dis-agreement with the theoretical modal due to the higher order modes neglected in the theoretical analysis.en_US
dc.description.degreeMaster of Engineering (MEngr)en_US
dc.description.degreetypeThesisen_US
dc.identifier.urihttp://hdl.handle.net/11375/30025
dc.language.isoenen_US
dc.subjectEngineeren_US
dc.titleTHE MICROWAVE MEASUREMENT OF THE COMPLEX PERMITIVITY OF SEMI-CONDUCTIVITYen_US
dc.typeThesisen_US

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