Please use this identifier to cite or link to this item:
http://hdl.handle.net/11375/31362Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Baek I | - |
| dc.contributor.author | Gadsden SA | - |
| dc.contributor.author | Kim MS | - |
| dc.contributor.editor | Kim MS | - |
| dc.contributor.editor | Cho B-K | - |
| dc.contributor.editor | Chin BA | - |
| dc.contributor.editor | Chao K | - |
| dc.date.accessioned | 2025-03-03T23:27:19Z | - |
| dc.date.available | 2025-03-03T23:27:19Z | - |
| dc.date.issued | 2018-05-15 | - |
| dc.identifier.uri | http://hdl.handle.net/11375/31362 | - |
| dc.publisher | SPIE, the international society for optics and photonics | - |
| dc.subject | 4605 Data Management and Data Science | - |
| dc.subject | 46 Information and Computing Sciences | - |
| dc.title | Development of online whole-surface apple inspection system using line-scan hyperspectral imaging technology (Conference Presentation) | - |
| dc.type | Article | - |
| dc.date.updated | 2025-03-03T23:27:18Z | - |
| dc.contributor.department | Mechanical Engineering | - |
| dc.identifier.doi | https://doi.org/10.1117/12.2307235 | - |
| Appears in Collections: | Mechanical Engineering Publications | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 068-Development of online whole-surface apple inspection system using line-scan hyperspectral imaging technology (Conference Presentation).pdf | Supporting information | 552.64 kB | Adobe PDF | View/Open |
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