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Please use this identifier to cite or link to this item: http://hdl.handle.net/11375/29791
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DC FieldValueLanguage
dc.contributor.advisorMcLAY, A.B.-
dc.contributor.authorLEUNG, MAN-KIT PHILIP-
dc.date.accessioned2024-05-14T15:14:58Z-
dc.date.available2024-05-14T15:14:58Z-
dc.date.issued1961-09-
dc.identifier.urihttp://hdl.handle.net/11375/29791-
dc.description.abstractA detail description of the apparatus for field intensity measurement was given in Chapter I. Field behaviour inside the microwave absorbing walls without the prism was studied and described in Chapter II. Field patterns behind the totally reflecting surface of the prism modified by conducting and absorbing screens were studied and reported in Chapter III.en_US
dc.language.isoenen_US
dc.subjectPhysicsen_US
dc.titleTOTAL REFLECTION OF 3.2 cm MICROWAVES III A DIELECTRIC PRISM MODIFIED BY CONDUCTING AND ABSORBING SCREENSen_US
dc.typeThesisen_US
dc.contributor.departmentPhysicsen_US
dc.description.degreetypeThesisen_US
dc.description.degreeMaster of Science (MS)en_US
Appears in Collections:Digitized Open Access Dissertations and Theses

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