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http://hdl.handle.net/11375/27756
Title: | RoMPE™ Product Summary |
Authors: | Bandler, John W. Optimization Systems Associates Biernacki, R.M. Chen, S.H. Zhang, Q.J. |
Keywords: | RoMPE;Optimization Systems Associates;microwaves;FET;parameter extraction;optimization;Materka and Kacprzak model;field-effect transistors;device modeling;L1, L2 optimization;small-signal measurements;S parameters |
Publication Date: | Oct-1988 |
Publisher: | Optimization Systems Associates |
Citation: | Optimization Systems Associates Inc., RoMPE™ Product Summary, October 1988. |
Abstract: | RoMPE™ (Robust Model Parameter Extractor) is a very powerful program for extraction of FET model parameters from measurement data. It benefits from several years of theoretical research and incorporates the latest results by Bandler, Chen, Ye and Zhang: "Robust model parameter extraction using large-scale optimization concepts", 1988 IEEE MTT-S International Microwave Symposium Digest (New York, NY), pp. 319-322. RoMPE accepts measurement data in the form of small-signal S-parameter and/or DC bias measurements. Depending on what type of data is available, RoMPE can be used to extract DC model parameters, small-signal model parameters, or, as a unique feature, both DC and small-signal parameters simultaneously. RoMPE offers the combined power of novel techniques in device modeling and the state-of-the-art gradient-based L1 and L2 optimizers through a friendly and uncomplicated user-interface. The input file adopts a format similar to that of Super-Compact® and Microwave Harmonica™. The program also features high-quality graphics displays. Currently, RoMPE supports two popular FET models, namely the Materka and Kacprzak model and the Microwave Harmonica™ model. October 1988 |
Description: | OSA's first product RoMPE™ (Robust Model Parameter Extractor) is a very powerful program for extraction of FET model parameters from measurement data. Unveiled in New York at the 1988 IEEE MTT-S International Microwave Symposium, RoMPE is the world's first commercially available software system dedicated to nonlinear FET model parameter extraction suitable for microwave circuit design. |
URI: | http://hdl.handle.net/11375/27756 |
Appears in Collections: | Optimization Systems Associates |
Files in This Item:
File | Description | Size | Format | |
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Bandler_OSA_RoMPE_PRODUCT_SUMMARY_Oct_1988.pdf | 232.59 kB | Adobe PDF | View/Open |
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