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Studying Strain and Device Reliability in ill-V Ridge Waveguide DFB Diode Lasers Using the Degree of Polarisation of Photoluminescence (DOP) 409

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Studying Strain and Device Reliability in ill-V Ridge Waveguide DFB Diode Lasers Using the Degree of Polarisation of Photoluminescence (DOP) 12 7 5 14 21 13 1

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