Propagation Characteristics of Microstrip Transmission Lines on Intrinsic Germanium Substrates

Abstract

<p> The microstrip transmission line has been theoretically analysed using conformal transformation and variational techniques. The variational method has been used to compute the line capacitance, characteristic impedance and guide wavelength of the following microstrip structures: (i) Microstrip transmission lines having negligible and finite strip conductor thickness. (ii) Microstrip transmission lines on two layer dielectric substrates having negligible and finite strip conductor thickness.</p><p> The total losses incurred in microstrip lines on semiconductor substrates have been included. An experimental technique (based on the Deschamps method) for measuring the characteristic impedance of microstrip lines through a lossy junction using a high precision microwave reflection bridge has been described. Measurements of the characteristic impedance of microstrip lines on intrinsic germanium substrates have been carried out at 9.38 GHz, and good agreement between the theoretical and experimental results have been obtained.</p>