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http://hdl.handle.net/11375/13480
Title: | Unveiling Transient Behaviors in Heterostructure Nanowires |
Authors: | Boulanger, Jonathan P. |
Advisor: | LaPierre, Ray |
Department: | Engineering Physics |
Keywords: | nanowire;epitaxy;electron microscopy;III-V semiconductors;vapor liquid solid;heterostructures;Electronic Devices and Semiconductor Manufacturing;Nanoscience and Nanotechnology;Nanotechnology fabrication;Semiconductor and Optical Materials;Electronic Devices and Semiconductor Manufacturing |
Publication Date: | Oct-2013 |
Abstract: | <p>GaAs/GaP heterostructure nanowires (NWs) were grown on GaAs(111)B and Si(111) substrates by gold (Au) assisted vapor-liquid-solid (VLS) growth in a molecular beam epitaxy (MBE) system. NW morphology and crystal structure were characterized by scanning electron microscopy (SEM) and transmission electron microscopy (TEM). Early results indicated substantial differences in the length and crystal structure of the GaAs/GaP heterostructures. Efforts to remove these inhomogeneities required an improved Au VLS seed deposition method as well as a better understanding of VLS growth across GaAs/GaP hetero-interfaces.</p> <p>Experiments with GaAs/GaP heterostructures yielded the observation of changes in crystal phase in GaP, including the first reported occurrence of the 4H polytype. These observations revealed the presence of transient growth behavior during the formation of the GaAs to GaP hetero-interface that was unique to the VLS technique. Further characterization required the need to move from VLS seeds formed by annealing thin Au films to Au particles formed precisely by electron beam lithography (EBL). NW growth using EBL patterned Au seeds was discovered to be inhibited by the formation of a thin silicon oxide layer, formed at low temperatures by Au-enhanced silicon oxidation. Elimination of this layer immediately prior to growth resulted in successful patterned VLS growth.</p> <p>A systematic study of the transient GaP growth behavior was then conducted using patterned arrays to grow GaAs/GaP heterostructure NWs with frequent, periodic oscillations in the group V composition. These oscillations were measured by high angle annular dark field (HAADF) to determine the instantaneous growth rate of many NWs. A phenomenological model was fit to the data and transient growth rate behavior following a GaAs to GaP hetero-interface was understood on the basis of transient droplet compositions, which arise due to the large difference in As or P alloy concentrations required to reach the critical supersaturation.</p> |
URI: | http://hdl.handle.net/11375/13480 |
Identifier: | opendissertations/8306 9424 4626462 |
Appears in Collections: | Open Access Dissertations and Theses |
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