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Please use this identifier to cite or link to this item: http://hdl.handle.net/11375/12886
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dc.contributor.advisorPreston, J.S.en_US
dc.contributor.authorJovanovic, Stephen M.en_US
dc.date.accessioned2014-06-18T17:01:04Z-
dc.date.available2014-06-18T17:01:04Z-
dc.date.created2013-03-18en_US
dc.date.issued2013-04en_US
dc.identifier.otheropendissertations/7734en_US
dc.identifier.other8792en_US
dc.identifier.other3920540en_US
dc.identifier.urihttp://hdl.handle.net/11375/12886-
dc.description.abstract<p>The growth of CdTe thin films on Al<sub>2</sub>O<sub>3 </sub>(0001) substrates by pulsed laser deposition from undoped pressed powder targets was studied. Thin film crystal structure was investigated by x-ray texture analysis as a function of plume flux, growth temperature and film thickness. Crystal texture increased for a decrease in plume flux. Single crystal CdTe (111) films were obtained by optimizing the plume flux. Increasing the growth temperature demonstrated a reduction in twin density. An optimum temperature of 300°C minimized the twin density without adverse desorption effects. The twin density decreased as an inverse squared function of film thickness. Single crystal CdTe films with comparable structural quality to Bridgeman single crystal wafers were grown under optimal conditions.</p> <p>The optoelectronic properties of CdTe films were investigated by photoluminescence and photoreflectance spectroscopy. The room temperature bandgap energy of 1.51 eV was consistent between spectroscopic measurements. Broadening parameters for spectra were consistent with reference high quality material. Low temperature photoluminescence spectra had a dominant emission consistent with bound excitons found in bulk CdTe. Emissions consistent with self-compensation or doping were not found. Hall effect and conductivity measurements at 300 K demonstrated high resistivity for undoped material and electron mobilities comparable to bulk CdTe for lightly doped films. Spectroscopic and electrical measurements of high structural quality CdTe films were consistent with high optoelectronic quality.</p> <p>An as-grown ability of the films to detach from their substrate was discovered. X-ray texture analysis and photoluminescence spectroscopy of films released onto rigid secondary carriers demonstrated that they maintained their structural and optoelectronic quality proceeding lift-off. Substrates having films released from them were found to be suitable for repeated growth. The technological relevance of this discovery is likely to drive further study into the lift-off phenomena and controlled doping of CdTe thin films.</p>en_US
dc.subjectCadmium Tellurideen_US
dc.subjectPulsed Laser Depositionen_US
dc.subjectHeteroepitaxyen_US
dc.subjectSemiconductor and Optical Materialsen_US
dc.subjectSemiconductor and Optical Materialsen_US
dc.titlePulsed Laser Heteroepitaxy of High Quality CdTe Thin Films on Sapphire Substratesen_US
dc.typethesisen_US
dc.contributor.departmentEngineering Physicsen_US
dc.description.degreeMaster of Applied Science (MASc)en_US
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