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Browsing by Author Thompson, D.A.

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
 
Showing results 1 to 20 of 21  next >
Publication DateTitleAuthor(s)
1980Application of Ion Implantation Techniques to Anode Electrocatalyst Development for Use in Alkaline Water ElectrolysisAkano, Gbadebo Usman
Jun-1995The cleaning of InP substrates for growth by MBEHofstra, Peter
Dec-1975Computer Simulation of Ion ImplantationEl-Agizi, George Nabil
1998Design, Fabrication and Characterization of n-Channel InGaAsP-InP Based Inversion Channel Technology Devices (ICT) for Optoelectronic Integrated Circuits (OEIC): Double Heterojunction Optoelectronic Switches (DOES), Heterojunction Field-Effect Transistors (HFET), Bipolar Inversion Channel Field-Effect Transistors (BICFET) and Bipolar Inversion Channel Phototransistors (BICPT).Tan, Eugene
Mar-1980The Development of a Medium Energy Ion Reflection Spectrometer and Some Problems Associated with its Application to Materials AnalysisPoehlman, Frederick Skipper William
Nov-1993Effects of intentionally introduced mismatch strain on the operating characteristics and temperature performance of indium gallium arsenic phosphide/indium phosphide long wavelength semiconductor lasersEvans, Douglas John
Oct-1995GSMBE GROWTH AND CHARACTERIZATION OF InGaAs-lnP STRUCTURES ON SiO2 PATTERNED SUBSTRATESNagy, Susan Carol
Sep-1997GSMBE growth on V-groove patterned substrates for InP-based quantum wiresWang, Jun
Oct-1986Ion Beam Mixing and Electrocatalysis of Platinum-Iron AlloysFernandes, Mark G.
1987Ion Beam Mixing and Electrocatalytic Characteristics of Thin Film Ni/Pd Surface AlloysAkano, Gbadebo Usman
Aug-1986Ion Beam Mixing and Thermoelectric Characteristics of Bi-Sb Thin Film AlloysIbrahim, Mahmoud Ahmad
Jul-1985Ion Implantation Damage In Cds Using Tem and RBS/ChannelingParikh, Rasiklal Nalin
Feb-1991Ion Implantation Damage in QuartzMacaulay-Newcombe, George Richard
Jul-1977Ion Implantation Damage in Semiconductors at Low TemperaturesWalker, Sulis Robert
1975Nitrogen Implanted α-SiC : A Correlation Between Electrical (C-V) Measurements and Damage Studies Using the Channeling Technique.Chan, Albert M. C.
1997On non-uniform pumping effects in semiconductor lasersSwoger, James
May-1991Permeation and Thermal Desorption Studies of Deuterium Diffusion and Trapping in Ion-Implanted NickelShi, San-Qiang
Aug-1980Some Ion-Bombardment Effects on Copper-Gold AlloysNewcombe, Richard G.
Jun-1990Surface Segregation on Co-Rh and Oxidation of Ni-Co AlloysEllison, Anthony Keith
Sep-1995Temperature-Dependcnt Growth of InP By Plasma-Enhanced GSMBEMitchell, Bruce Daniel
Showing results 1 to 20 of 21  next >
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