Browsing by Author Bassim, Nabil
Showing results 1 to 8 of 8
Publication Date | Title | Author(s) |
---|---|---|
2020 | Advanced Characterization of Cementitious Materials | Dong, Peng |
Nov-2023 | ADVANCED MICROSTRUCTURAL CHARACTERIZATION OF HIGH STRENGTH LOW ALLOY STEELS | Gu, Chen |
2023 | Advanced Processing of Scanning Electron Microscopy Images in 2-D and 3-D Datasets | Khoonkari, Nasim |
2020 | The Application of Focused Ion Beam Technology to the Modification and Fabrication of Photonic and Semiconductor Elements | Wong, Connor |
2019 | Characterization and simulation of electron/ion beam damage on soft materials in FIB-SEM microscopes | Zhang, Weiwei |
2019 | A Comparison of Beam Induced Damage from Xenon and Gallium Focused Ion Beams | Norris, Samuel |
2019 | CONTROL OF SILVER AND SILICON MICROSTRUCTURE VIA LOW DOSE ION IMPLANTATION | Chi, Longxing |
2021 | Multiscale Electron Microscopy Imaging and Spectroscopy of Atomically Thin Layers at Heteroepitaxial Interfaces | El-Sherif, Hesham |
Showing results 1 to 8 of 8