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Browsing by Subject device characterization

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
 
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Publication DateTitleAuthor(s)
Apr-2012NEW TUNER CHARACTERIZATION AND GAIN COMPENSATION TECHNIQUES FOR ON-WAFER MICROWAVE NOISE MEASUREMENTYang, Benson
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